• DocumentCode
    2016902
  • Title

    A new method to achieve RF linearity in SOI nanowire MOSFETs

  • Author

    Razavieh, Ali ; Singh, Navab ; Paul, Abhijeet ; Klimeck, Gerhard ; Janes, David ; Appenzeller, Joerg

  • Author_Institution
    Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN, USA
  • fYear
    2011
  • fDate
    5-7 June 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Our experiments show that linearity can be achieved if transistors are designed to operate in the one-dimensional ballistic transport regime in the quantum capacitance limit. We report third order intercept points (IIP3) of around -13dBm at maximum transconductance under these particular transport and device operation conditions, meeting the requirements for state-of-the-art mobile communication systems. The advantage of our approach becomes most apparent when normalizing the IIP3 values with power at maximum transconductance. In this case we were able to show that more than 10dB improvement over devices operating in the velocity saturation regime is achieved. Our findings make our approach an excellent candidate for low power applications in the early stages of RF receivers when linearity is critical.
  • Keywords
    MOSFET; low-power electronics; mobile communication; nanowires; radio receivers; silicon-on-insulator; RF linearity; RF receivers; SOI nanowire MOSFET; Si; low power applications; maximum transconductance; mobile communication systems; one-dimensional ballistic transport regime; quantum capacitance limit; third order intercept points; velocity saturation regime; Ballistic transport; Linearity; Logic gates; Quantum capacitance; Radio frequency; Transconductance; 1-D Transport; Ballistic Transport; Linearity; Nanowire Transistor; Quantum Capacitance; RF CMOS; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits Symposium (RFIC), 2011 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1529-2517
  • Print_ISBN
    978-1-4244-8293-1
  • Electronic_ISBN
    1529-2517
  • Type

    conf

  • DOI
    10.1109/RFIC.2011.5940626
  • Filename
    5940626