Title :
THz near-field optics and microscopy
Author :
Planken, P. C M ; van Rimenam, C.E.W.M. ; van der Valk, N.C.J.
Author_Institution :
Fac. of Appl. Sci., Delft Univ. of Technol., Netherlands
Abstract :
The paper presents measurements which allow to separately measure the near-field contributions from the tip shaft, and those of the tip apex for THz imaging and spectroscopy. In addition, for the first time, spectroscopically resolved THz measurements of a TO-phonon of a crystal (CsI) having sub-wavelength dimensions is shown. Measurements show that it is possible to measure and identify crystals of dimensions much smaller than the THz wavelength. This may find applications in the screening of substances of which only a single (crystalline) grain is available.
Keywords :
caesium compounds; near-field scanning optical microscopy; phonons; submillimetre wave imaging; submillimetre wave spectroscopy; CsI; CsI crystal; THz microscopy; THz near-field optics; TO-phonon; spectroscopically resolved THz measurements; tip apex; tip shaft; Antenna measurements; Biomedical optical imaging; Crystallization; Intensity modulation; Optical imaging; Optical microscopy; Polarization; Probes; Spectroscopy; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics Society, 2004. LEOS 2004. The 17th Annual Meeting of the IEEE
Print_ISBN :
0-7803-8557-8
DOI :
10.1109/LEOS.2004.1363265
