DocumentCode
2017266
Title
A high-isolation 60GHz CMOS transmit/receive switch
Author
Kuo, Chi-Shin ; Kuo, Hsin-Chih ; Chuang, Huey-Ru ; Chen, Chu-Yu ; Huang, Tzuen-Hsi
Author_Institution
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
fYear
2011
fDate
5-7 June 2011
Firstpage
1
Lastpage
4
Abstract
This paper presents a 60GHz high-isolation CMOS single-pole double-throw (SPDT) transmitter/receiver (T/R) switch fabricated with TSMC standard 90-nm 1P9M CMOS technology. A low insertion loss and high linearity are achieved by using the body-floating technique. The leakage cancellation technique is used to increase the isolation between the transmitter and receiver ports. The top metal (M9) is mainly adopted for designing signal paths and the microstrip-line matching elements. In order to minimize the substrate loss, the first metal (M1) as the ground plane is used in this design. The measured results show the insertion loss from the transmitter port to the antenna port is less than 3.5 dB, and the isolation between the transmitter and receiver ports is higher than 28 dB from 57 to 64GHz. At the center frequency of 60GHz, the port isolation is higher than 34 dB and the input 1-dB compression point (IP1dB) is +6.9 dBm.
Keywords
CMOS integrated circuits; field effect MIMIC; microstrip lines; microwave switches; 1P9M CMOS technology; SPDT T-R switch; TSMC; antenna port; body-floating technique; frequency 57 GHz to 64 GHz; ground plane; high-isolation CMOS single-pole double-throw transmitter/receiver switch; insertion loss; leakage cancellation technique; microstrip-line matching elements; size 90 nm; transmitter port; CMOS integrated circuits; CMOS technology; Insertion loss; Phase shifters; Switches; Switching circuits; Transistors; 60GHz; Body-floating; CMOS; T/R switch; V-band; high isolation; leakage cancellation; single-pole double-throw (SPDT);
fLanguage
English
Publisher
ieee
Conference_Titel
Radio Frequency Integrated Circuits Symposium (RFIC), 2011 IEEE
Conference_Location
Baltimore, MD
ISSN
1529-2517
Print_ISBN
978-1-4244-8293-1
Electronic_ISBN
1529-2517
Type
conf
DOI
10.1109/RFIC.2011.5940638
Filename
5940638
Link To Document