• DocumentCode
    2017312
  • Title

    Simultaneous switching noise predictors for CMOS OCDs

  • Author

    Katopis, G. ; Lin, Phillip

  • Author_Institution
    IBM Corp., Poughkeepsie, NY, USA
  • fYear
    1994
  • fDate
    2-4 Nov 1994
  • Firstpage
    39
  • Lastpage
    42
  • Abstract
    In this paper closed form expressions are derived for the estimation of the switching noise generated by CMOS driver circuits with short channel. The results of ASX simulations that establish the accuracy of these predictors are also shown
  • Keywords
    CMOS integrated circuits; ASX simulations; CMOS OCDs; predictors; short channel driver circuits; simultaneous switching noise; Accuracy; Circuit noise; Circuit simulation; Driver circuits; Equations; Integrated circuit noise; Predictive models; Semiconductor device modeling; Switching circuits; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic packaging, 1994., IEEE 3rd Topical Meeting on
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    0-7803-2411-0
  • Type

    conf

  • DOI
    10.1109/EPEP.1994.594064
  • Filename
    594064
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2017312