EBIC Investigations on Active Polymer Devices

Author

Pugatschow, A. ; Heiderhoff, R. ; Forster, Michael ; Scherf, U. ; Balk, L.J.

Author_Institution

Univ. of Wuppertal, Wuppertal

fYear

2007

fDate

11-13 July 2007

Abstract

For the first time, EBIC microscopy is applied for investigations on active polymer devices, OFETs with TPA-Dimethyl and P3HT polymers as active layers. The internal electrical field distributions of these devices are characterized in dependence on biasing conditions. Poole-Frenkel field dependences at source and drain contacts are demonstrated.

Keywords

EBIC; Poole-Frenkel effect; electric fields; field effect transistors; organic semiconductors; polymers; EBIC microscopy; OFET; P3HT polymers; Poole-Frenkel field; TPA-Dimethyl; active layers; active polymer devices; internal electrical field distributions; Charge carriers; Electron beams; Microscopy; OFETs; Organic light emitting diodes; Polymers; Pulse amplifiers; Signal processing; Silicon; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Physical and Failure Analysis of Integrated Circuits, 2007. IPFA 2007. 14th International Symposium on the

Conference_Location

Bangalore

Print_ISBN

978-1-4244-1014-9

Type

conf

DOI

10.1109/IPFA.2007.4378088

Filename

4378088

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2017742