Title :
EBIC Investigations on Active Polymer Devices
Author :
Pugatschow, A. ; Heiderhoff, R. ; Forster, Michael ; Scherf, U. ; Balk, L.J.
Author_Institution :
Univ. of Wuppertal, Wuppertal
Abstract :
For the first time, EBIC microscopy is applied for investigations on active polymer devices, OFETs with TPA-Dimethyl and P3HT polymers as active layers. The internal electrical field distributions of these devices are characterized in dependence on biasing conditions. Poole-Frenkel field dependences at source and drain contacts are demonstrated.
Keywords :
EBIC; Poole-Frenkel effect; electric fields; field effect transistors; organic semiconductors; polymers; EBIC microscopy; OFET; P3HT polymers; Poole-Frenkel field; TPA-Dimethyl; active layers; active polymer devices; internal electrical field distributions; Charge carriers; Electron beams; Microscopy; OFETs; Organic light emitting diodes; Polymers; Pulse amplifiers; Signal processing; Silicon; Voltage;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2007. IPFA 2007. 14th International Symposium on the
Conference_Location :
Bangalore
Print_ISBN :
978-1-4244-1014-9
DOI :
10.1109/IPFA.2007.4378088
