DocumentCode :
2018209
Title :
Low power wideband receiver and transmitter chipset for mm-wave imaging in SiGe bipolar technology
Author :
Tiebout, M. ; Wohlmuth, H.-D. ; Knapp, H. ; Salerno, R. ; Druml, M. ; Kaeferboeck, J. ; Rest, M. ; Wuertele, J. ; Ahmed, S.S. ; Schiessl, A. ; Juenemann, R.
Author_Institution :
INFINEON Technol., Villach, Austria
fYear :
2011
fDate :
5-7 June 2011
Firstpage :
1
Lastpage :
4
Abstract :
This paper presents a chip-set aiming at high resolution imaging systems for people screening applications operating near the W-band. The center frequency of operation is 78GHz with a 3-dB bandwidth of at least 7GHz for optimal image resolution and depth of focus. The frequency generation for both receive and transmit chips consists of a frequency quadrupler consisting of 2 cascaded active Gilbert mixers. The receiver RFIC contains 4 channels including LO generation and distribution. The measured receiver conversion gain is 23dB with a SSB NF below 10dB over a wide frequency range from 70GHz up to 82GHz. The transmitter RFIC includes LO generation, distribution and 4 output amplifiers with an output power of more than 0 dBm in a frequency range from 77GHz to 85GHz. Both receiver and transmitter ICs are supplied from a single 3.3V supply voltage and the power consumption per channel is below 160mW.
Keywords :
Ge-Si alloys; low-power electronics; millimetre wave imaging; mixers (circuits); radio receivers; radio transmitters; radiofrequency integrated circuits; SiGe bipolar technology; W-band; active Gilbert mixer; depth of focus; frequency 70 GHz to 82 GHz; frequency 77 GHz to 85 GHz; frequency 78 GHz; frequency generation; frequency quadrupler; gain 23 dB; low power wideband receiver; mm-wave imaging; optimal image resolution; receiver RFIC; receiver conversion gain; transmitter chipset; voltage 3.3 V; Imaging; Mixers; Radar imaging; Radiofrequency integrated circuits; Receivers; Semiconductor device measurement; Transmitters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2011 IEEE
Conference_Location :
Baltimore, MD
ISSN :
1529-2517
Print_ISBN :
978-1-4244-8293-1
Electronic_ISBN :
1529-2517
Type :
conf
DOI :
10.1109/RFIC.2011.5940671
Filename :
5940671
Link To Document :
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