• DocumentCode
    2018448
  • Title

    A V-band self-healing power amplifier with adaptive feedback bias control in 65 nm CMOS

  • Author

    Liu, Jenny Yi-Chun ; Tang, Adrian ; Wang, Ning-Yi ; Gu, Qun Jane ; Berenguer, Roc ; Hsieh, Hsieh-Hung ; Wu, Po-Yi ; Jou, Chewnpu ; Chang, Mau-Chung Frank

  • Author_Institution
    Univ. of California, Los Angeles, CA, USA
  • fYear
    2011
  • fDate
    5-7 June 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A self-healing two-stage 60 GHz power amplifier (PA) with amplitude/phase compensation is realized in 65 nm CMOS. An adaptive feedback bias scheme with three control knobs is proposed to extend the linear operating region and enhance chip-to-chip performance yield; allowing a 5.5 dB improvement of the output 1-dB compression point (P1dB) and a less than 2% chip-to-chip gain variation. At a 1 V supply, the fully differential PA achieves a saturation output power (Psat) of 14.85 dBm with a peak power-added-efficiency (PAE) of 16.2%. With the on-chip amplitude compensation, the P1dB is extended to 13.7 dBm. With the on-chip phase compensation, the output phase variation is minimized to less than 0.5 degree. To the best of our knowledge, this PA provides the highest Psat and P1dB with simultaneous high PAE for a single PA reported to date. The PA delivers a linear gain of 9.7 dB and has a 7 GHz bandwidth from 55.5 to 62.5 GHz with a very compact area of 0.042 mm2.
  • Keywords
    CMOS analogue integrated circuits; MMIC power amplifiers; adaptive control; field effect MIMIC; CMOS; PAE; V-band self-healing power amplifier; adaptive feedback bias control; amplitude/phase compensation; chip-to-chip performance; frequency 55.5 GHz to 62.5 GHz; frequency 60 GHz; frequency 7 GHz; gain 5.5 dB; gain 9.7 dB; peak power-added-efficiency; size 65 nm; voltage 1 V; CMOS integrated circuits; Gain; Linearity; Logic gates; Power amplifiers; Power generation; Semiconductor device measurement; CMOS; V-band; millimeter wave integrated circuits; power amplifier; transformers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits Symposium (RFIC), 2011 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1529-2517
  • Print_ISBN
    978-1-4244-8293-1
  • Electronic_ISBN
    1529-2517
  • Type

    conf

  • DOI
    10.1109/RFIC.2011.5940683
  • Filename
    5940683