DocumentCode
2018448
Title
A V-band self-healing power amplifier with adaptive feedback bias control in 65 nm CMOS
Author
Liu, Jenny Yi-Chun ; Tang, Adrian ; Wang, Ning-Yi ; Gu, Qun Jane ; Berenguer, Roc ; Hsieh, Hsieh-Hung ; Wu, Po-Yi ; Jou, Chewnpu ; Chang, Mau-Chung Frank
Author_Institution
Univ. of California, Los Angeles, CA, USA
fYear
2011
fDate
5-7 June 2011
Firstpage
1
Lastpage
4
Abstract
A self-healing two-stage 60 GHz power amplifier (PA) with amplitude/phase compensation is realized in 65 nm CMOS. An adaptive feedback bias scheme with three control knobs is proposed to extend the linear operating region and enhance chip-to-chip performance yield; allowing a 5.5 dB improvement of the output 1-dB compression point (P1dB) and a less than 2% chip-to-chip gain variation. At a 1 V supply, the fully differential PA achieves a saturation output power (Psat) of 14.85 dBm with a peak power-added-efficiency (PAE) of 16.2%. With the on-chip amplitude compensation, the P1dB is extended to 13.7 dBm. With the on-chip phase compensation, the output phase variation is minimized to less than 0.5 degree. To the best of our knowledge, this PA provides the highest Psat and P1dB with simultaneous high PAE for a single PA reported to date. The PA delivers a linear gain of 9.7 dB and has a 7 GHz bandwidth from 55.5 to 62.5 GHz with a very compact area of 0.042 mm2.
Keywords
CMOS analogue integrated circuits; MMIC power amplifiers; adaptive control; field effect MIMIC; CMOS; PAE; V-band self-healing power amplifier; adaptive feedback bias control; amplitude/phase compensation; chip-to-chip performance; frequency 55.5 GHz to 62.5 GHz; frequency 60 GHz; frequency 7 GHz; gain 5.5 dB; gain 9.7 dB; peak power-added-efficiency; size 65 nm; voltage 1 V; CMOS integrated circuits; Gain; Linearity; Logic gates; Power amplifiers; Power generation; Semiconductor device measurement; CMOS; V-band; millimeter wave integrated circuits; power amplifier; transformers;
fLanguage
English
Publisher
ieee
Conference_Titel
Radio Frequency Integrated Circuits Symposium (RFIC), 2011 IEEE
Conference_Location
Baltimore, MD
ISSN
1529-2517
Print_ISBN
978-1-4244-8293-1
Electronic_ISBN
1529-2517
Type
conf
DOI
10.1109/RFIC.2011.5940683
Filename
5940683
Link To Document