Title :
Studying the electrical impedance variations in banana ripening using electrical impedance spectroscopy (EIS)
Author :
Chowdhury, A. ; Bera, T.K. ; Ghoshal, D. ; Chakraborty, B.
Author_Institution :
Dept. of Electron. & Commun. Eng., N.I.T. Agartala, Agartala, India
Abstract :
Electrical Impedance of biological tissues changes with the change in tissue anatomy and tissue physiology. Electrical Impedance Spectroscopy (EIS) has been studied to characterize the biological objects like fruits and vegetables for assessing their freshness. In this direction, the EIS studies have been conducted as a non-destructive investigation evaluation method to study the electrical impedance variations in banana ripening. The aim of the work is to correlate the impedance variation with the ripening process in banana. A small amount of alternating current is injected to the banana attached to an array of Ag/AgCl electrodes and the surface potentials are measured using Agilent 4294A impedance Analyzer. The banana impedance and phase angles are measured from 50 Hz and 1 MHz. The results demonstrate that the electrical impedance of banana varies significantly during its ripening. From the experimental studies, it is observed that the impedance, real part and imaginary part of the impedance all are increased with the progresses in the banana ripening process.
Keywords :
agricultural products; electric impedance measurement; nondestructive testing; quality control; EIS; banana ripening; biological tissues; electrical impedance spectroscopy; electrical impedance variations; fruits freshness assessment; nondestructive method; tissue physiology; vegetables; Biological tissues; Current measurement; Frequency measurement; Impedance; Impedance measurement; Spectroscopy; Banana; Banana ripening; EIS; Nyquist Plots; bioelectrical impedance; electrical impedance spectroscopy; impedance variations;
Conference_Titel :
Computer, Communication, Control and Information Technology (C3IT), 2015 Third International Conference on
Conference_Location :
Hooghly
Print_ISBN :
978-1-4799-4446-0
DOI :
10.1109/C3IT.2015.7060196