DocumentCode
2019128
Title
Soft error considerations for computer web servers
Author
Wang, Fan ; Agrawal, Vishwani D.
Author_Institution
Juniper Networks, Inc., Sunnyvale, CA, USA
fYear
2010
fDate
7-9 March 2010
Firstpage
269
Lastpage
274
Abstract
Soft errors are caused by cosmic rays striking sensitive regions in electronic devices. Termed as single event upset (SEU), in the past this phenomenon mostly affected the high altitude systems or avionics. The small geometries of today´s nanodevices and their use in high-density and high-complexity designs make electronic systems sensitive even to the ground-level radiation. Therefore, large computer systems like workstations or computer web servers have become major victims of single event upsets. Given that the idea of cloud computing is an unavoidable trend for the next generation internet, which might involve almost every company in the IT industry, the urgency and criticality of the reliability rise higher then ever. This paper illustrates how soft errors are a reliability concern for computer servers. The soft error reduction techniques that are significant for the IT industry are summarized and a possible soft error rate (SER) reduction method that considers the cosmic ray striking angle to redesign the circuit board layout is proposed.
Keywords
Internet; avionics; cosmic background radiation; cosmic rays; error analysis; file servers; integrated circuit layout; nanoelectronics; IT industry; SER reduction method; SEU; avionics; circuit board layout design; cloud computing; computer web servers; cosmic ray striking angle; electronic devices; ground-level radiation; high altitude systems; nanodevices; next generation internet; single event upset; soft error rate reduction method; Aerospace electronics; Cloud computing; Computer errors; Computer industry; Cosmic rays; Geometry; Internet; Single event upset; Web server; Workstations;
fLanguage
English
Publisher
ieee
Conference_Titel
System Theory (SSST), 2010 42nd Southeastern Symposium on
Conference_Location
Tyler, TX
ISSN
0094-2898
Print_ISBN
978-1-4244-5690-1
Type
conf
DOI
10.1109/SSST.2010.5442820
Filename
5442820
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