Title : 
A 1-bit digital dynamically biased power amplifier for step envelope tracking transmitters
         
        
            Author : 
Cidronali, A. ; Magrini, I. ; Fagotti, R. ; Mercanti, M. ; Manes, G.
         
        
            Author_Institution : 
Dept. of Electron. & Telecommun., Univ. of Florence, Florence, Italy
         
        
        
            fDate : 
Sept. 29 2009-Oct. 1 2009
         
        
        
        
            Abstract : 
This paper focuses and provides experimental data for a 1-bit step envelope tracking power amplifier as a suitable solution to enhance the average PAE for wide dynamic signals. The PA is based on an active core realized combining SiGe HBTs with different sizes, which shows a peak CW PAE around 38% for the state 1 and 42% for state 2 respectively when terminated with optimum terminations. The 1-bit step envelope tracking architecture and its digital predistortion algorithm were implemented in a laboratory test bench. The experimental characterization demonstrates the capability of the proposed system to provide a factor two of improvement in terms of average PAE, without limitation of other signal parameters. Experimental validation is reported for a 2 MHz multi-sine signal with 5.5 dB PAR at 2.074 GHz and for a 17 dBm output total power.
         
        
            Keywords : 
Ge-Si alloys; UHF power amplifiers; heterojunction bipolar transistors; radio transmitters; HBT; SiGe; digital dynamically biased power amplifier; digital predistortion; frequency 2 MHz; frequency 2.074 GHz; multisine signal; signal parameters; step envelope tracking transmitters; word length 1 bit; Germanium silicon alloys; Heterojunction bipolar transistors; Linearity; Microwave amplifiers; Peak to average power ratio; Power amplifiers; Power generation; Power supplies; Silicon germanium; Transmitters; Envelope tracking; SiGe HBT; reconfigurable devices;
         
        
        
        
            Conference_Titel : 
Microwave Conference, 2009. EuMC 2009. European
         
        
            Conference_Location : 
Rome
         
        
            Print_ISBN : 
978-1-4244-4748-0