DocumentCode :
2019642
Title :
Progress in circuit oriented techniques for electrical interconnect and package (EIP) modeling
Author :
Ruehli, Albert
Author_Institution :
Res. Div., IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear :
1994
fDate :
2-4 Nov 1994
Firstpage :
59
Lastpage :
61
Abstract :
The tools and techniques for EIP modeling are continuously evolving perhaps at a slower pace than the VLSI system technology. VLSI systems involve millions of components and it is impossible to exactly model such complex systems. Continuous progress in the tools and techniques allows the modeling of larger portions of such systems. This paper summarizes recent progress of circuit oriented techniques for EIP and gives an outline of some new techniques and issues for the solution of larger systems in the time domain
Keywords :
VLSI; EIP modeling; VLSI system technology; circuit oriented techniques; electrical interconnect; package; Distributed parameter circuits; Equivalent circuits; Finite difference methods; Geometry; Integrated circuit interconnections; Packaging; SPICE; Solid modeling; Transmission line matrix methods; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic packaging, 1994., IEEE 3rd Topical Meeting on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-2411-0
Type :
conf
DOI :
10.1109/EPEP.1994.594073
Filename :
594073
Link To Document :
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