• DocumentCode
    2019642
  • Title

    Progress in circuit oriented techniques for electrical interconnect and package (EIP) modeling

  • Author

    Ruehli, Albert

  • Author_Institution
    Res. Div., IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    1994
  • fDate
    2-4 Nov 1994
  • Firstpage
    59
  • Lastpage
    61
  • Abstract
    The tools and techniques for EIP modeling are continuously evolving perhaps at a slower pace than the VLSI system technology. VLSI systems involve millions of components and it is impossible to exactly model such complex systems. Continuous progress in the tools and techniques allows the modeling of larger portions of such systems. This paper summarizes recent progress of circuit oriented techniques for EIP and gives an outline of some new techniques and issues for the solution of larger systems in the time domain
  • Keywords
    VLSI; EIP modeling; VLSI system technology; circuit oriented techniques; electrical interconnect; package; Distributed parameter circuits; Equivalent circuits; Finite difference methods; Geometry; Integrated circuit interconnections; Packaging; SPICE; Solid modeling; Transmission line matrix methods; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic packaging, 1994., IEEE 3rd Topical Meeting on
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    0-7803-2411-0
  • Type

    conf

  • DOI
    10.1109/EPEP.1994.594073
  • Filename
    594073