DocumentCode :
2020355
Title :
Radiation analysis of embedded capacitor based on HFSS
Author :
Ying, Liang ; Chunyue, Huang ; Liangbin, Zhang Long Shao ; Wei, Huang ; Tianming, Li
Author_Institution :
Department of Electronic Engineering, Chengdu Aeronautic Vocational and Technical College, China
fYear :
2015
fDate :
11-14 Aug. 2015
Firstpage :
631
Lastpage :
633
Abstract :
The simulation model of embedded capacitor radiation was established based on HFSS (High Frequency Simulator Structure) software in this paper. Radiation problem of the embedded capacitor at high frequency was studied by the model. Its near-field radiant power gain was obtained and the effects of the variations of the signal frequency, capacitance plate radius and dielectric thickness on radiation power gain were analyzed. The analysis results are shown as follows:near-field radiation power gain of embedded capacitor changes accordingly with the change of the signal frequency; within a certain range of electrode plate radius, radiation power increases with the increase of electrode plate radius; and in a certain range of dielectric thickness, near-field radiation power decreases with the increase of dielectric thickness.
Keywords :
Analytical models; Dielectrics; Packaging; HFSS simulation; dielectric thickness; electrode plate radius; embedded capacitor; near-field radiant power;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
Conference_Location :
Changsha, China
Type :
conf
DOI :
10.1109/ICEPT.2015.7236665
Filename :
7236665
Link To Document :
بازگشت