• DocumentCode
    2020484
  • Title

    Packaging and Feedthrough Modes of Wafer Level for RF MEMS Switches

  • Author

    Wu, Qun ; He, Xun-jun ; Jin, Bo-shi ; Song, Ming-Xin ; Yin, Jing-Hua

  • Author_Institution
    Sch. of Electron. & Inf. Technol., Harbin Inst. of Technol.
  • fYear
    2006
  • fDate
    12-14 Sept. 2006
  • Firstpage
    165
  • Lastpage
    168
  • Abstract
    This paper reports on the methods, feedthrough modes and RF performance of wafer level packaging for RF MEMS switches. By analyzing the effects of packaging methods and feedthrough modes on the cost, weight, size, loss, RF performance and function of switches, a novel wafer level packaging structure which is performed using the wafer-level microencapsulation on the thin silicon substrate as the RF MEMS switches wafer with the vertical feedthroughs is presented. This structure has some advantages, such as low thickness, low parasitic capacity, short electric path, lightweight, no real ring and compatibility with the devices fabrication processes. Therefore, for RF applications, the packaging structure obviously reduces electric path loss and fabrication cost, and provides better RF performance of RF MEMS switches
  • Keywords
    encapsulation; microswitches; silicon; wafer level packaging; RF MEMS switches; electric path loss; feedthrough modes; vertical feedthroughs; wafer level packaging method; wafer-level microencapsulation; Cost function; Fabrication; Packaging; Performance analysis; Performance loss; Radio frequency; Radiofrequency microelectromechanical systems; Silicon; Switches; Wafer scale integration; Packaging; RF MEMS; Switches; Wafer Level;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    RF and Microwave Conference, 2006. RFM 2006. International
  • Conference_Location
    Putra Jaya
  • Print_ISBN
    0-7803-9744-4
  • Electronic_ISBN
    0-7803-9745-2
  • Type

    conf

  • DOI
    10.1109/RFM.2006.331061
  • Filename
    4133576