• DocumentCode
    2021307
  • Title

    Test procedure of indoor lighting LED luminaires based on step-stress accelerated degradation test

  • Author

    Tian, Wanchun ; Cai, Miao ; Zhang, Weihai ; Tian, Kunmiao ; Zhang, Ping ; Chen, Xianping ; Yang, Daoguo

  • Author_Institution
    Guangxi Key Laboratory of Manufacturing System and Advanced Manufacturing Technology, Guilin University of Electronic Technology, 541004, China
  • fYear
    2015
  • fDate
    11-14 Aug. 2015
  • Firstpage
    793
  • Lastpage
    798
  • Abstract
    LED luminaire system has lots of failure modes. And the interaction among various failure mechanisms is extremely complex. There is a great obstacle existed in assessing the system reliability of LED luminaires. Therefore, in order to quickly and accurately assess the reliability of LED luminaires products, a test procedure for indoor lighting LED luminaires is initially proposed in this study. Firstly, according to the characteristics of LED luminaires, the sample size and corresponding confidence level are selected. Secondly, in order to overcome the influence of LED luminaire weaknesses on reliability assessment, LED luminaire is decomposed into several independent subsystems, and then step stress accelerated tests are conducted on the LED light source subsystem only, which is placed in a thermal chamber and connected to other subsystems outside the aging furnace. The test stress level, the step size, the measurement method and failure criteria are determined while considering that sample has a sufficient amount of degradation under each stress level. Finally, the reliability of LED luminaires is achieved after carrying out the degradation modeling, the distribution analysis and the reliability function calculation. The proposed procedure is further expected to be one of technical specifications on assessing the reliability of LED luminaire system in the future.
  • Keywords
    Correlation coefficient; Degradation; Humidity; Light emitting diodes; Reliability; Stress; Stress measurement; LED luminaires; degradation; step stress; subsysetm; system reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
  • Conference_Location
    Changsha, China
  • Type

    conf

  • DOI
    10.1109/ICEPT.2015.7236701
  • Filename
    7236701