DocumentCode :
2021845
Title :
Reliable, Addressable, Dual Beam Laser Diodes For Redundancy And/or Parallel Operations At 780 nm And 830 nm
Author :
Zucker, Erik P. ; Craig, Richard R.
Author_Institution :
Spectra Diode Laboratories
fYear :
1992
fDate :
16-19 Nov 1992
Firstpage :
359
Lastpage :
360
Keywords :
Degradation; Diode lasers; Electrostatic discharge; Laser beams; Optical crosstalk; Power generation; Power lasers; Redundancy; Semiconductor laser arrays; Stimulated emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
LEOS '92, Conference Proceedings. IEEE Lasers and Electro-Optics Society, 1992 Annual Meeting
Print_ISBN :
0-7803-0526-4
Type :
conf
DOI :
10.1109/LEOS.1992.693991
Filename :
693991
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2021845
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