Title :
Design of GLFSR based test processor chip
Author :
Kabir, Mohammod Akbar ; Ali, Liakot
Author_Institution :
Dept. of Econ., Univ. of Dhaka, Dhaka, Bangladesh
Abstract :
The key components of all electronic equipment are integrated circuits (ICs). Due to the improvement of integration technology, the complexity of such circuit is increasing rapidly. It has become a challenge to test ICs with reliable performance in respect to storage requirement, test application time and fault coverage. In this paper we investigate the performance of Generalized Linear Feedback Shift Register (GLFSR) based test processor implementing mixed-mode testing technique. It is shown that GLFSR based Test processor performs better in testing of IC.
Keywords :
circuit complexity; circuit feedback; fault simulation; integrated circuit reliability; integrated circuit testing; mixed analogue-digital integrated circuits; shift registers; GLFSR based test processor chip; IC testing; circuit complexity; electronic equipment; fault coverage; generalized linear feedback shift register; integrated circuit; integration technology; mixed-mode testing; reliable performance; storage requirement; test application time; Decision support systems; Testing; ATE; CUT; GLFSR; IC; PRV;
Conference_Titel :
Research and Development (SCOReD), 2009 IEEE Student Conference on
Conference_Location :
UPM Serdang
Print_ISBN :
978-1-4244-5186-9
Electronic_ISBN :
978-1-4244-5187-6
DOI :
10.1109/SCORED.2009.5443091
