A unified approach for a time-domain built-in self-test technique and fault detection

Author

Provost, B. ; Brosa, A.M. ; Sánchez-Sinencio, E.

Author_Institution

Dept. of Electr. Eng., Texas A&M Univ., TX, USA

fYear

1998

fDate

19-21 Feb 1998

Firstpage

230

Lastpage

236

Abstract

Being able to fully test a circuit is an important issue for quality manufacturing. Unlike fault analysis for digital circuits, analog fault analysis has been comparatively slow to evolve. The purpose of this paper is to study the feasibility of the time domain response analysis as a test method for analog circuits. The approach was to first study the fault coverage obtained by testing the main parameters of the new NGCC amplifier, which shows the feasibility of built-in self test in time-domain. A circuit macromodel to implement a time-domain built-in self-test circuit was then proposed

Keywords

analogue integrated circuits; built-in self test; fault diagnosis; integrated circuit testing; time-domain analysis; NGCC amplifier; analog fault analysis; built-in self test; circuit macromodel; fault coverage; fault detection; time-domain technique; Analog circuits; Automatic testing; Built-in self-test; Circuit analysis; Circuit faults; Circuit testing; Digital circuits; Electrical fault detection; Fault detection; Manufacturing; Time domain analysis; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI, 1998. Proceedings of the 8th Great Lakes Symposium on

Conference_Location

Lafayette, LA

ISSN

1066-1395

Print_ISBN

0-8186-8409-7

Type

conf

DOI

10.1109/GLSV.1998.665234

Filename

665234