Title :
JEOL provides total solution and flexibility in the world of electron microscopy for the new era of bio-engineering and nano-technology [advertisement]
Abstract :
Advertisement: JEOL provides total solution and flexibility in the world of electron microscopy for the new era of bio-engineering and nano-technology.
Conference_Titel :
RF and Microwave Conference, 2006. RFM 2006. International
Conference_Location :
Putra Jaya
Print_ISBN :
0-7803-9744-4
DOI :
10.1109/RFM.2006.331131
