DocumentCode :
2022544
Title :
Character Line Segmentation Based on Feature Clustering
Author :
Xi, Yan ; Chen, Youbin ; Liao, Qingmin ; Winghong, Leung ; Shunming, Fung ; Jiangwen, Deng
Author_Institution :
Tsinghua Univ., Shenzhen
Volume :
1
fYear :
2007
fDate :
23-26 Sept. 2007
Firstpage :
402
Lastpage :
406
Abstract :
A novel character line segmentation method for degraded binary images based on feature clustering is proposed in this paper. The application of this research is to segment character lines on images of IC chip surfaces. First, several cutting lines are detected and every two neighbor cutting lines define a candidate character line (CCL). Second, the feature of each CCL is extracted and clustering is used to choose real character lines (RCL) from CCLs. Third, a postprocessing step is applied to confirm or refine the character line segmentation results. Experiments have demonstrated that this novel method can find all the character lines in degraded document images of IC chip surfaces quickly and accurately and is robust to images with background noise and logo.
Keywords :
feature extraction; image segmentation; optical character recognition; IC chip surfaces; candidate character line; character line segmentation; cutting lines; degraded binary images; document images; feature clustering; real character lines; Application specific integrated circuits; Automation; Background noise; Character recognition; Degradation; Image segmentation; Integrated circuit noise; Noise robustness; Optical character recognition software; Surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Document Analysis and Recognition, 2007. ICDAR 2007. Ninth International Conference on
Conference_Location :
Parana
ISSN :
1520-5363
Print_ISBN :
978-0-7695-2822-9
Type :
conf
DOI :
10.1109/ICDAR.2007.4378740
Filename :
4378740
Link To Document :
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