• DocumentCode
    2022776
  • Title

    Millimeter-Wave Monolithic Integrated Circuits

  • Author

    Spielman, B.E.

  • Author_Institution
    Naval Research Laboratory, Washington, DC, U.S.A.
  • fYear
    1986
  • fDate
    8-12 Sept. 1986
  • Firstpage
    89
  • Lastpage
    94
  • Abstract
    This paper summarizes the progress, trends, and technical issues associated with monolithic millimeter-wave integrated circuit technology. Presented first is background information which sets forth a description of the opportunities which spur this activity, and a summary of the important technical challenges. The technical challenges encompass aspects of: semicondutor material growth and processing; solid-state source performance; device and circuit characterization, de-embedding and modeling; and automated testing. Next, a discussion is provided of the semiconductor device types and circuit media which serve as building blocks for this technology. Device types treated here include sources, mixer/detectors, and modulators. The material offered relating to circuit media contrasts the attributes of monolithic approaches with those of waveguide and hybrid techniques. The paper concludes with a description of salient monolithic programs which benchmark the status of current effort in the U.S. This description includes a summary of important technical issues and research thrusts.
  • Keywords
    Automatic testing; Circuit testing; Integrated circuit technology; MIMICs; Materials testing; Millimeter wave integrated circuits; Semiconductor devices; Semiconductor materials; Solid modeling; Solid state circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1986. 16th European
  • Conference_Location
    Dublin, Ireland
  • Type

    conf

  • DOI
    10.1109/EUMA.1986.334177
  • Filename
    4133660