Title : 
Design and fabrication of short gate-length heterostructure charge coupled devices for transversal filter applications
         
        
            Author : 
Tan, Hiang Teik ; Hunter, Ian C. ; Snowden, Christopher M. ; Ranson, Richard
         
        
            Author_Institution : 
Sch. of Electron. & Electr. Eng., Leeds Univ., UK
         
        
        
        
        
        
            Abstract : 
This paper presents the first reported quarter-micron double delta doped AlGaAs/ InGaAs charge coupled device for microwave filter applications. The design and fabrication of conventional and multi tapped delay line MMICs for RF filter applications are also discussed. Schrodinger and Poisson´s equations are self consistently solved with current continuity equations to show the variation in channel charge concentration as the gate voltages are varied. The device is implemented as a recessed capacitive gate structure which is fabricated using established GaAs heterostructure MMIC technology to ensure good repeatability.
         
        
            Keywords : 
III-V semiconductors; MMIC; Poisson equation; Schrodinger equation; aluminium compounds; charge-coupled devices; gallium arsenide; indium compounds; microwave filters; semiconductor device models; transversal filters; AlGaAs-InGaAs; GaAs heterostructure MMIC technology; Poisson equations; RF filter; Schrodinger equations; channel charge concentration; microwave filter; multitapped delay line MMIC; quarter-micron double delta doped; recessed capacitive gate structure; short gate-length heterostructure charge coupled devices; transversal filter; Charge-coupled image sensors; Delay lines; Fabrication; Indium gallium arsenide; MMICs; Microwave devices; Microwave filters; Poisson equations; Radio frequency; Transversal filters;
         
        
        
        
            Conference_Titel : 
Gallium Arsenide and Other Semiconductor Application Symposium, 2005. EGAAS 2005. European
         
        
            Conference_Location : 
Paris
         
        
            Print_ISBN : 
88-902012-0-7