• DocumentCode
    2023189
  • Title

    Novel base doping profile for improved speed and power

  • Author

    Rehder, E.M. ; Cismaru, C. ; Zampardi, P.J. ; Welser, R.E.

  • Author_Institution
    Kopin Corp., Taunton, MA, USA
  • fYear
    2005
  • fDate
    3-4 Oct. 2005
  • Firstpage
    157
  • Lastpage
    160
  • Abstract
    We have experimentally studied the effect of two new base doping profiles on the base transit time of a GaAs npn heterojunction bipolar transistor. The doping in a region close to the collector is reduced either by a doping grade or a stepwise reduction. Quasi-electric fields resulting from these doping gradients increase the minority carrier velocity and the beta of large area transistors. By focusing these doping changes adjacent to the collector, the amount of low-doped base material and the resulting increase in base sheet resistance can be minimized. For both a step change in doping or graded doping change a 10% decrease in base transit time is achieved while only causing a 4 % increase in base sheet resistance. The impact on base transit time is confirmed with f/sub T/ data on small area devices.
  • Keywords
    III-V semiconductors; gallium arsenide; heterojunction bipolar transistors; semiconductor doping; GaAs; base doping profile; npn heterojunction bipolar transistor; quasi-electric fields; Current density; Current measurement; Density measurement; Doping profiles; Electrical resistance measurement; Electrons; Frequency measurement; Gain measurement; Gallium arsenide; Heterojunction bipolar transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Gallium Arsenide and Other Semiconductor Application Symposium, 2005. EGAAS 2005. European
  • Conference_Location
    Paris
  • Print_ISBN
    88-902012-0-7
  • Type

    conf

  • Filename
    1637174