DocumentCode
2023189
Title
Novel base doping profile for improved speed and power
Author
Rehder, E.M. ; Cismaru, C. ; Zampardi, P.J. ; Welser, R.E.
Author_Institution
Kopin Corp., Taunton, MA, USA
fYear
2005
fDate
3-4 Oct. 2005
Firstpage
157
Lastpage
160
Abstract
We have experimentally studied the effect of two new base doping profiles on the base transit time of a GaAs npn heterojunction bipolar transistor. The doping in a region close to the collector is reduced either by a doping grade or a stepwise reduction. Quasi-electric fields resulting from these doping gradients increase the minority carrier velocity and the beta of large area transistors. By focusing these doping changes adjacent to the collector, the amount of low-doped base material and the resulting increase in base sheet resistance can be minimized. For both a step change in doping or graded doping change a 10% decrease in base transit time is achieved while only causing a 4 % increase in base sheet resistance. The impact on base transit time is confirmed with f/sub T/ data on small area devices.
Keywords
III-V semiconductors; gallium arsenide; heterojunction bipolar transistors; semiconductor doping; GaAs; base doping profile; npn heterojunction bipolar transistor; quasi-electric fields; Current density; Current measurement; Density measurement; Doping profiles; Electrical resistance measurement; Electrons; Frequency measurement; Gain measurement; Gallium arsenide; Heterojunction bipolar transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Gallium Arsenide and Other Semiconductor Application Symposium, 2005. EGAAS 2005. European
Conference_Location
Paris
Print_ISBN
88-902012-0-7
Type
conf
Filename
1637174
Link To Document