Title :
System-level simulation of a noisy phase-locked loop
Author :
Herzel, Frank ; Piz, Maxim
Author_Institution :
IHP, Frankfurt, Germany
Abstract :
This paper presents a compact model of a noisy phase-locked loop (PLL) for inclusion in a time-domain system simulation. The phase noise of the reference is modeled as a Wiener process, and the phase noise contribution of the voltage-controlled oscillator (VCO) is described as an Ornstein-Uhlenbeck process. The model is applied to phase error modeling for a 60 GHz OFDM system including correction of the common phase error. A close agreement is observed between the time-domain simulation and a frequency-domain model.
Keywords :
OFDM modulation; phase locked loops; phase noise; stochastic processes; time-domain analysis; voltage-controlled oscillators; 60 GHz; OFDM system; Ornstein-Uhlenbeck process; PLL; VCO; Wiener process; common phase error; frequency-domain model; noisy phase-locked loop; phase noise; system-level simulation; voltage-controlled oscillator; Circuit simulation; Clocks; Error correction; Jitter; Low pass filters; OFDM; Phase frequency detector; Phase locked loops; Phase noise; Voltage-controlled oscillators;
Conference_Titel :
Gallium Arsenide and Other Semiconductor Application Symposium, 2005. EGAAS 2005. European
Conference_Location :
Paris
Print_ISBN :
88-902012-0-7
