DocumentCode :
2023470
Title :
Extraction of small signal equivalent circuit model parameters for statistical modeling of HBT using artificial neural
Author :
Taher, H. ; Schreurs, D. ; Nauwelaers, B.
Author_Institution :
K.U. Leuven, Belgium
fYear :
2005
fDate :
3-4 Oct. 2005
Firstpage :
213
Lastpage :
216
Abstract :
We found different performances for the same device due to the variations in the process from die to the other on the same wafer or on another one. Yield analysis becomes one of the important tools into commercial computer aided design (CAD) programs. Statistical issues are crucial in yield analysis for microwave circuits. Yield analysis needs accurate statistical properties between the parameters of devices´ models to reflect correctly the physical variations. Normally, on the level of the device modeling, the statistical properties between the model parameters like means and standard deviations are noisy by using the known techniques (optimization-based and direct) for extracting the small signal equivalent circuit model parameters of active microwave devices. We introduce how is artificial neural network (ANN) accurate and efficient statistical extraction method for small signal model parameters of hetero junction bipolar transistor (HBT). Utilizing this methodology provides a robust statistical model for our device.
Keywords :
electronic engineering computing; equivalent circuits; heterojunction bipolar transistors; neural nets; semiconductor device models; statistical analysis; ANN; HBT; artificial neural network; hetero junction bipolar transistor; small signal equivalent circuit model parameters; statistical extraction method; statistical modeling; Active noise reduction; Artificial neural networks; Circuit analysis; Circuit noise; Design automation; Equivalent circuits; Heterojunction bipolar transistors; Microwave circuits; Microwave devices; Semiconductor device modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Gallium Arsenide and Other Semiconductor Application Symposium, 2005. EGAAS 2005. European
Conference_Location :
Paris
Print_ISBN :
88-902012-0-7
Type :
conf
Filename :
1637188
Link To Document :
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