DocumentCode
2023503
Title
A measurement system for FET derivative extraction under dynamic operating regime
Author
Pena, R. ; Gómez, C. ; García, J.A.
Author_Institution
Dept. of Commun. Eng., Cantabria Univ., Santander, Spain
fYear
2005
fDate
3-4 Oct. 2005
Firstpage
217
Lastpage
220
Abstract
This paper presents a novel measurement system for derivative extraction under dynamic conditions based on the utilization of pulsed signals. This kind of characterization avoids unrealistic heating and trapping effects, making possible to realize the extraction process under conditions as close as possible to the device RF behaviour. The system principles and set-up are presented and described in order to provide reliable device modelling. Moreover, results of the derivative extraction process for an FLL177ME MESFET are presented with the aim of highlighting the existing differences between pulsed and traditional DC derivative characterization.
Keywords
Schottky gate field effect transistors; semiconductor device models; FET derivative extraction; MESFET; dynamic operating regime; pulsed signals; Current measurement; Electromagnetic heating; FETs; Gallium arsenide; Microwave devices; Nonlinear dynamical systems; Performance evaluation; Pulse measurements; Radio frequency; Signal generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Gallium Arsenide and Other Semiconductor Application Symposium, 2005. EGAAS 2005. European
Conference_Location
Paris
Print_ISBN
88-902012-0-7
Type
conf
Filename
1637189
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