• DocumentCode
    2023658
  • Title

    An improvement of membrane structure of MEMS piezoresistive pressure sensor

  • Author

    Huang, Zebang ; Ma, Xiaosong

  • Author_Institution
    Mechanical Engineering School, Guilin University of electronic technology, NO. 1 Jinji Road, Guangxi, China, 541004
  • fYear
    2015
  • fDate
    11-14 Aug. 2015
  • Firstpage
    1174
  • Lastpage
    1179
  • Abstract
    This paper describes an improvement of the membrane structure of MEMS piezoresistive(PZR) pressure sensor. Finite element method (FEM) is applied to design and optimize the property of PZR the membrane structure and piezoresistors stress analysis is performed under the rated pressure. An equation that transfers the simulation stress data into output voltage is proposed in this paper according to the Wheatstone bridge principle and piezoresisitive effect in silicon. In order to achieve better sensor performance, several kinds of output voltage curve of the membrane structure were contrasted to obtain a suitable membrane structure. The design parameters of the pressure sensor include membrane size and shape and the location of piezoresistance. After that the pressure-output characteristic, the nonlinear error of the optimization sensor and the mechanical stability were analyzed. The results confirmed that the optimization structure has good sensitivity and linearity. It is a kind of high stability, high sensitivity, and low linear error of MEMS PZR pressure sensor.
  • Keywords
    Finite element analysis; Piezoresistance; Piezoresistive devices; Sensitivity; Silicon; Stress; FEM; MEMS; linearity; membrane structure; piezoresistive pressure sensor; sensitivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
  • Conference_Location
    Changsha, China
  • Type

    conf

  • DOI
    10.1109/ICEPT.2015.7236789
  • Filename
    7236789