DocumentCode
2023725
Title
A simple model to characterize social networks
Author
Rui Zeng ; Hong Shen ; Tian Wei Xu
Author_Institution
Sch. of Inf. Sci. & Technol., Yunnan Normal Univ., Kunming, China
fYear
2012
fDate
12-14 Dec. 2012
Firstpage
13
Lastpage
17
Abstract
For the purpose of prediction analysis of customer relationships in social networks, this paper proposes a simple model that can generate future states of a social network based on relevant data analysis. In this model, nodes and edges of the social network are inserted at the same preferential attachment probabilities, but deleted at different anti-preferential attachment probabilities. In this model, we consider the limit of the network size, the directions of incident links and the factor of time in attractiveness when deleting nodes. Networks generated from this model have a nice property that the degree distribution follows the power-law, which desirably characterizes an essential property of social networks. This property is derived by applying the mean-field theory [7]. It is validated through simulation: we use C++, MATLAB to generate the degree distribution map of our model, and PAJEK to draw the topology map of social networks that was generated by our model. We also show that networks generated from our model can self-organize into scale-free networks. If -C - 1<; E <; m-2C/2, deleting nodes will not result in destruction of the network.
Keywords
complex networks; customer relationship management; data analysis; probability; topology; C++; MATLAB; PAJEK; customer relationship; data analysis; degree distribution map; incident link; mean-field theory; prediction analysis; preferential attachment probability; scale-free network; social network; topology map; Complex networks; Data models; Fans; Predictive models; Social network services; Topology; anti-preferential attachment probability; degree distribution; mean-field theory; node deletion; power-law distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Networks (ICON), 2012 18th IEEE International Conference on
Conference_Location
Singapore
ISSN
1556-6463
Print_ISBN
978-1-4673-4521-7
Type
conf
DOI
10.1109/ICON.2012.6506526
Filename
6506526
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