Title :
An empirical large signal model for silicon carbide MESFETs
Author :
Sayed, Ahmed ; Boeck, Georg
Author_Institution :
Microwave Eng. Group, Technische Univ. Berlin, Germany
Abstract :
In this paper, a large signal table-based model for SiC MESFET is presented. A packaged commercially available high power MESFET device (CREE CRF24010) is adopted for the model development. The extracted bias-dependent elements of the small signal model as well as the measured DC data are mathematically described by small modification of Angelov´s formulation. Dispersion between DC and RF characteristics of the drain current is also observed and interpreted. The new model is capable to predict small signal as well as large signal performance accurately. A single stage ultra broadband 5 W power amplifier has been developed to verify the derived model. A good agreement has been obtained between simulated and measured results.
Keywords :
power MESFET; semiconductor device models; silicon compounds; wide band gap semiconductors; wideband amplifiers; 5 W; SiC; empirical large signal model; silicon carbide MESFET; ultra broadband power amplifier; Broadband amplifiers; Data mining; MESFETs; Mathematical model; Packaging; Power amplifiers; Predictive models; Radio frequency; Radiofrequency amplifiers; Silicon carbide;
Conference_Titel :
Gallium Arsenide and Other Semiconductor Application Symposium, 2005. EGAAS 2005. European
Conference_Location :
Paris
Print_ISBN :
88-902012-0-7