Title : 
A low phase noise low dc power quadrature voltage-controlled oscillator using a 0.18-µm CMOS process
         
        
            Author : 
Lin, Chi-Hsien ; Chang, Hong-Yeh
         
        
            Author_Institution : 
Dept. of Electr. Eng., Nat. Central Univ., Jhongli, Taiwan
         
        
        
        
        
        
            Abstract : 
This paper describes a low phase noise low dc power quadrature voltage controlled oscillator (QVCO) with a reflection-type IQ modulator. The QVCO using a standard bulk 0.18-mum CMOS process achieves a low phase noise of -115 dBc/Hz at 1-MHz offset frequency, a figure of merit (FOM) of - 191 dBc/Hz, and a core dc power consumption of 5.8 mW with a supply voltage of 1.8 V. The tuning frequency of the QVCO is from 13.4 to 14.4 GHz. The amplitude and phase errors of the QVCO are within 0.5 dB and 3deg, respectively. To the best of the authors´ knowledge, this work demonstrates the best FOM among all the reported Si-based QVCOs above 10 GHz.
         
        
            Keywords : 
CMOS integrated circuits; MMIC oscillators; circuit tuning; field effect MMIC; integrated circuit noise; low-power electronics; modulators; phase noise; voltage-controlled oscillators; CMOS process; MMIC process; amplitude error; core dc power consumption; figure of merit; frequency 13.4 GHz to 14.4 GHz; low phase noise low dc power QVCO; monolithic microwave integrated circuit; offset frequency; phase error; power 5.8 mW; quadrature voltage-controlled oscillator; reflection-type IQ modulator; tuning frequency; voltage 1.8 V; CMOS process; Energy consumption; Frequency; Germanium silicon alloys; MMICs; Microwave integrated circuits; Phase noise; Silicon germanium; Voltage; Voltage-controlled oscillators; CMOS; modulator; monolithic microwave integrated circuit (MMIC); quadrature voltage controlled oscillator (QVCO);
         
        
        
        
            Conference_Titel : 
Microwave Integrated Circuits Conference, 2009. EuMIC 2009. European
         
        
            Conference_Location : 
Rome
         
        
            Print_ISBN : 
978-1-4244-4749-7