• DocumentCode
    2024148
  • Title

    Effect of viscoelastic behavior of EMC on predicting QFN fatigue life

  • Author

    Shen, Huiqiang ; Qin, Fei ; Wu, Wei ; Xia, Guofeng

  • Author_Institution
    College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, China
  • fYear
    2015
  • fDate
    11-14 Aug. 2015
  • Firstpage
    1242
  • Lastpage
    1246
  • Abstract
    Epoxy molding compounds (EMCs) are widely used in encapsulation of various semiconductor devices. QFN package has been widely accepted in electronic packaging industry in recent years due to due to its smaller dimension, excellent thermal and electrical performance. In this study, the tensile tests based on Dynamic Mechanical Analyzer (DMA) experiment are employed to investigate the viscoelastic behavior a commercial EMC material. FEM is used to analyze the effect of EMC viscoelasticity by EMC constant elastic and viscoelastic model based on generalized Maxwell model and WLF equation. The results show the difference of von Mises stress for EMC elastic and viscoelastic material models is not obvious while equivalent plastic strain reveals very significant difference. The predicted fatigue life of QFN package is underestimated about 45% if EMC is assumed to be elastic instead of viscoelastic. It is necessary to perform viscoelastic analysis during the prediction of fatigue life.
  • Keywords
    Electromagnetic compatibility; Fatigue; Lead; Reliability; EMCs; FEM; QFN; fatigue life; viscoelastic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
  • Conference_Location
    Changsha, China
  • Type

    conf

  • DOI
    10.1109/ICEPT.2015.7236804
  • Filename
    7236804