DocumentCode :
2024428
Title :
The merits of open bath immersion cooling of datacom equipment
Author :
Tuma, Phillip E
Author_Institution :
3M Center, 3M Co., St. Paul, MN, USA
fYear :
2010
fDate :
21-25 Feb. 2010
Firstpage :
123
Lastpage :
131
Abstract :
This paper discusses the economic and environmental merits of passive 2-phase immersion in semi-open baths of dielectric fluid for cooling datacom equipment such as servers. The technique eliminates the need for hermetic connectors, pressure vessels, seals and clamshells typically associated with immersion cooling and the connectors, plumping, pumps and cold plates associated with more traditional liquid cooling techniques. A board level power density of 11.7W/cm2 can be sustained with 100 cm3 of fluid per kW. The modular 80 kW baths modeled can eject 130 kW per m2 of floor space via water-cooled condensers. It is estimated that 28°C water at 15 gpm could maintain average CPU junction temperatures, Tj<;60°C and 62°C water at 30 gpm could maintain Tj<;85°C, maximizing the availability of the heat for other purposes. Alternatively, the heat can be transferred directly to ambient air without water as an intermediate. The costs and greenhouse gas emissions associated with conservative annual fluid emission estimates are found to be less than those associated with the electrical power required for traditional chassis fans and liquid pumps. Since these fugitive losses occur at one point, more efficient capture techniques can be easily applied.
Keywords :
cooling; data communication equipment; heat exchangers; datacom equipment; dielectric fluid; evaporative bath; fluoroketone; open bath immersion cooling; water-cooled condensers; Cold plates; Connectors; Dielectrics; Environmental economics; Immersion cooling; Power generation economics; Pumps; Seals; Water conservation; Water heating; 2-phase; cooling; data center; datacenter; datacom; evaporative bath; fluoroketone; immersion; open bath; passive;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2010. SEMI-THERM 2010. 26th Annual IEEE
Conference_Location :
Santa Clara, CA
ISSN :
1065-2221
Print_ISBN :
978-1-4244-9458-3
Electronic_ISBN :
1065-2221
Type :
conf
DOI :
10.1109/STHERM.2010.5444305
Filename :
5444305
Link To Document :
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