Title :
Atomic spectral analyzers for radio frequency signal processing
Author :
Le Gouët, J.L. ; Lorgeré, I. ; Bretenaker, Fabien ; Lavielle, V. ; Crozatier, V.
Author_Institution :
Campus Univ., Orsay, France
Abstract :
We review recent demonstrations of wide band radio frequency (RF) spectral analyzers based on spectral hole burning technology. The optically-carried RF signal can be analyzed with sub-MHz resolution over tens of GHz instantaneous bandwidth.
Keywords :
microwave photonics; optical hole burning; spectral analysers; atomic spectral analyzers; optically-carried RF signal; radio frequency signal processing; spectral hole burning; Atom optics; Atomic measurements; Bandwidth; Optical signal processing; Radio frequency; Signal analysis; Signal processing; Signal resolution; Spectral analysis; Wideband;
Conference_Titel :
Lasers and Electro-Optics Society, 2004. LEOS 2004. The 17th Annual Meeting of the IEEE
Print_ISBN :
0-7803-8557-8
DOI :
10.1109/LEOS.2004.1363550
