Title :
Uncertainty estimation in SiGe HBT small-signal modeling
Author :
Masood, Syed M. ; Johansen, Tom K. ; Vidkjær, Jens ; Krozer, Viktor
Author_Institution :
Dept. of Electromagn. Syst., Tech. Univ. Denmark, Lyngby, Denmark
Abstract :
An uncertainty estimation and sensitivity analysis is performed on multi-step de-embedding for SiGe HBT small-signal modeling. The uncertainty estimation in combination with uncertainty model for deviation in measured S-parameters, quantifies the possible error value in de-embedded two-port parameters (Y and Z - parameters). The analysis is applied to a 0.35 /spl mu/m 60 GHz f/sub T/ SiGe HBT in frequency range 45 MHz to 26 GHz.
Keywords :
Ge-Si alloys; S-parameters; UHF bipolar transistors; VHF devices; heterojunction bipolar transistors; microwave bipolar transistors; millimetre wave bipolar transistors; semiconductor device models; semiconductor materials; sensitivity analysis; two-port networks; 45 MHz to 26 GHz; 60 GHz; HBT small-signal modeling; S-parameter measurement; SiGe; multistep deembedding; sensitivity analysis; two-port parameters; uncertainty estimation; Data mining; Frequency; Germanium silicon alloys; Heterojunction bipolar transistors; Integrated circuit interconnections; Scattering parameters; Sensitivity analysis; Silicon germanium; Stochastic processes; Uncertainty;
Conference_Titel :
Gallium Arsenide and Other Semiconductor Application Symposium, 2005. EGAAS 2005. European
Conference_Location :
Paris
Print_ISBN :
88-902012-0-7
