• DocumentCode
    2024725
  • Title

    An industrial case study of implementing and validating defect classification for process improvement and quality management

  • Author

    Freimut, Bernd ; Denger, Christian ; Ketterer, Markus

  • Author_Institution
    Fraunhofer IESE, Kaiserslautern
  • fYear
    2005
  • fDate
    1-1 Sept. 2005
  • Lastpage
    19
  • Abstract
    Defect measurement plays a crucial role when assessing quality assurance processes such as inspections and testing. To systematically combine these processes in the context of an integrated quality assurance strategy, measurement must provide empirical evidence on how effective these processes are and which types of defects are detected by which quality assurance process. Typically, defect classification schemes, such as ODC or the Hewlett-Packard scheme, are used to measure defects for this purpose. However, we found it difficult to transfer existing schemes to an embedded software context, where specific document- and defect types have to be considered. This paper presents an approach to define, introduce, and validate a customized defect classification scheme that considers the specifics of an industrial environment. The core of the approach is to combine the software engineering know-how of measurement experts and the domain know-how of developers. In addition to the approach, we present the results and experiences of using the approach in an industrial setting. The results indicate that our approach results in a defect classification scheme that allows classifying defects with good reliability, that allows identifying process improvement actions, and that can serve as a baseline for evaluating the impact of process improvements
  • Keywords
    program testing; quality assurance; software process improvement; software quality; Hewlett-Packard scheme; ODC; defect classification; defect measurement; process improvement; quality assurance assessment; quality management; software inspection; software testing; Automotive engineering; Computer aided software engineering; Electrostatic precipitators; Embedded software; Embedded system; Inspection; Quality assurance; Quality management; Software engineering; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Metrics, 2005. 11th IEEE International Symposium
  • Conference_Location
    Como
  • ISSN
    1530-1435
  • Print_ISBN
    0-7695-2371-4
  • Type

    conf

  • DOI
    10.1109/METRICS.2005.10
  • Filename
    1509297