Title :
325 watt from a single 1-cm 9xx laser diode bar on standard micro-channel cooler
Author :
Lichtenstein, Norbert ; Manz, Yvonne ; Mauron, Pascal ; Fily, Arnaud ; Schmidt, Berthold ; Müller, Jürgen ; Arit, S. ; Weiß, Stefan ; Thies, Achim ; Harder, Christian
Author_Institution :
Bookham AG, Zurich, Switzerland
Abstract :
325 W record-high CW output power from a single 1-cm laser bar and 100 W highly reliable aging tests results with 300 Mshots mean-time-to-failure (64 kh) in full pulsed mode operation (0 A to 100% current, 1.3 Hz, 50% duty-cycle) are presented based on telecom proven 9xx nm wavelength range (Al)Ga(In)As technology using E2 technology eliminating COMD.
Keywords :
III-V semiconductors; ageing; aluminium compounds; gallium compounds; indium compounds; laser modes; laser reliability; life testing; semiconductor device reliability; semiconductor device testing; semiconductor lasers; 1 cm; 1.3 Hz; 100 W; 325 W; 64000 h; AlGaInAs; E2 technology; laser diode bar; mean-time-to-failure; pulsed mode operation; reliable aging tests; standard microchannel cooler; Bars; Diode lasers; Laser modes; Mirrors; Optical pulses; Power generation; Power lasers; Pump lasers; Solid lasers; Testing;
Conference_Titel :
Lasers and Electro-Optics Society, 2004. LEOS 2004. The 17th Annual Meeting of the IEEE
Print_ISBN :
0-7803-8557-8
DOI :
10.1109/LEOS.2004.1363562
