Title :
Accuracy assessment of the BSIM3v3 MOSFET compact model for large signal RF applications
Author :
Vandamme, E.P. ; Schreurs, D. ; Dinther, C.
Author_Institution :
IMEC, Leuven, Belgium
Abstract :
The design of RF systems requires accurate models to describe both small signal and large signal RF analog behaviour of transistors. So far, compact models have received little attention with respect to modeling the large signal RF characteristics of silicon MOSFETs, despite their ability to predict device behaviour for different geometries, bias conditions and temperatures. However, circuit designers can benefit substantially from the scalability of compact models, not only by using their capabilities to design circuits at present, but also to predict the performance of RF systems made in next generation technologies. Therefore, the accuracy of compact models needs to be assessed. In this paper we validate the accuracy of the BSIM3v3 compact model for RF applications. We show that the BSIM3v3 model, with additional gate resistance, proves to meet the requirements of an accurate RF large signal model.
Keywords :
MOSFET; UHF field effect transistors; microwave field effect transistors; semiconductor device models; silicon; BSIM3v3 MOSFET compact model; Si; Si MOSFETs; gate resistance; large signal RF applications; large signal RF characteristics; model accuracy assessment; model parameters extraction; model scalability; transistor model; Geometry; MOSFET circuits; Predictive models; RF signals; Radio frequency; Scalability; Signal design; Silicon; Solid modeling; Temperature;
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 2000. Digest of Papers. 2000 Topical Meeting on
Conference_Location :
Garmisch, Germany
Print_ISBN :
0-7803-6255-1
DOI :
10.1109/SMIC.2000.844320