DocumentCode :
2025019
Title :
[2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Spine]
fYear :
2010
fDate :
21-25 Feb. 2010
Firstpage :
1
Lastpage :
1
Abstract :
Presents the spine of the 2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) proceedings.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2010. SEMI-THERM 2010. 26th Annual IEEE
Conference_Location :
Santa Clara, CA
ISSN :
1065-2221
Print_ISBN :
978-1-4244-9458-3
Electronic_ISBN :
1065-2221
Type :
conf
DOI :
10.1109/STHERM.2010.5444330
Filename :
5444330
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2025019
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