IDD waveforms analysis for testing of domino and low voltage static CMOS circuits

This paper describes a test method which relies on the actual observation of supply current (I_DD) waveforms. The method can be used to supplement the standard I_DDQ test method and it can be easily applied to dynamic and low V_DD, low V_T CMOS circuits. The method allows us to detect faults which may not be detected by I_DDQ test methods, and is sensitive enough to detect potential faults, which do not manifest themselves as functional errors. A simple built-in current sensor, which proves to be adequate in verifying the feasibility of using the I_DD waveforms analysis is proposed to safely observe the current waveforms without significantly changing the waveforms