Title :
Simultaneous switching noise measurement on a CMOS chip on an MLC SCM
Author :
Becker, W.D. ; Christian, K. ; Katopis, G. ; Kuppinger, S. ; McCredie, B.
Author_Institution :
IBM Corp., Poughkeepsie, NY, USA
Abstract :
The characterization of the simultaneous switching noise magnitude of 0.25 μm channel CMOS drivers obtained through high-frequency measurements is presented in this paper
Keywords :
CMOS integrated circuits; 0.25 micron; CMOS chip; CMOS drivers; MLC SCM; high-frequency measurements; simultaneous switching noise; CMOS technology; Circuit noise; Electrical resistance measurement; Noise measurement; Packaging; Performance evaluation; Probes; Semiconductor device measurement; Testing; Voltage;
Conference_Titel :
Electrical Performance of Electronic packaging, 1994., IEEE 3rd Topical Meeting on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-2411-0
DOI :
10.1109/EPEP.1994.594096
