• DocumentCode
    2025175
  • Title

    Floating Codes for Joint Information Storage in Write Asymmetric Memories

  • Author

    Anxiao Jiang ; Bohossian, V. ; Bruck, J.

  • Author_Institution
    Dept. of Comput. Sci., Texas A&M Univ., College Station, TX
  • fYear
    2007
  • fDate
    24-29 June 2007
  • Firstpage
    1166
  • Lastpage
    1170
  • Abstract
    Memories whose storage cells transit irreversibly between states have been common since the start of the data storage technology. In recent years, flash memories and other non-volatile memories based on floating-gate cells have become a very important family of such memories. We model them by the write asymmetric memory (WAM), a memory where each cell is in one of q states - state 0, 1, middotmiddotmiddot, q - 1 - and can only transit from a lower state to a higher state. Data stored in a WAM can be rewritten by shifting the cells to higher states. Since the state transition is irreversible, the number of times of rewriting is limited. When multiple variables are stored in a WAM, we study codes, which we call floating codes, that maximize the total number of times the variables can be written and rewritten. In this paper, we present several families of floating codes that either are optimal, or approach optimality as the codes get longer. We also present bounds to the performance of general floating codes. The results show that floating codes can integrate the rewriting capabilities of different variables to a surprisingly high degree.
  • Keywords
    codes; flash memories; data storage technology; flash memories; floating codes; floating-gate cells; joint information storage; nonvolatile memories; storage cells; write asymmetric memories; Complexity theory; Computer science; Electron traps; Flash memory; Nonvolatile memory; Robustness; Secondary generated hot electron injection; Threshold voltage; Tunneling; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory, 2007. ISIT 2007. IEEE International Symposium on
  • Conference_Location
    Nice
  • Print_ISBN
    978-1-4244-1397-3
  • Type

    conf

  • DOI
    10.1109/ISIT.2007.4557381
  • Filename
    4557381