DocumentCode
2025189
Title
Electrical characteristics of multiconductor interconnects with perforated reference planes
Author
Xue, Zhiyong ; Li, Zhenfan
Author_Institution
Dept. of Electron. Eng., Shanghai Jiaotong Univ., China
fYear
1994
fDate
2-4 Nov 1994
Firstpage
98
Lastpage
100
Abstract
A quasi-TEM approach is demonstrated for the equivalent transmission line characterization of multiconductor interconnects with perforated reference planes by using the “method of lines”. The proposed method can be used to obtain effective transmission line parameters for multiconductor interconnects
Keywords
integrated circuit interconnections; electrical characteristics; equivalent transmission line; method of lines; multiconductor interconnects; perforated reference planes; quasi-TEM method; Capacitance; Distributed parameter circuits; Electric variables; Electromagnetic propagation; Equations; Geometry; Impedance; Integrated circuit interconnections; Multiconductor transmission lines; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic packaging, 1994., IEEE 3rd Topical Meeting on
Conference_Location
Monterey, CA
Print_ISBN
0-7803-2411-0
Type
conf
DOI
10.1109/EPEP.1994.594097
Filename
594097
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