DocumentCode
2025373
Title
An empirical assessment of function point-like object-oriented metrics
Author
Del Bianco, Vieri ; Lavazza, Luigi
Author_Institution
CEFRIEL, Politecnico di Milano, Milan
fYear
2005
fDate
1-1 Sept. 2005
Lastpage
40
Abstract
Since object-oriented programming became a popular development practice, researchers and practitioners have defined several techniques aimed at measuring object-oriented software. Among these, several function point-like approaches have been proposed. However, mapping the concepts at the basis of function point analysis onto object-oriented concepts is not straightforward; therefore, there is the need to test the validity of FP-based object-oriented metrics. This paper presents an analysis of a set of programs developed by masteral students of a software engineering course employing object-oriented techniques (UML and Java). Different kinds of FP-based object-oriented metrics were applied, and the results analysed. The work done addresses questions like the following: is there a correlation between object-oriented FPs and LOCs? How do object-oriented FPs compare with the function points defined by Albrecht? How do object-oriented FPs compare with non FP-like OO metrics? How do object-oriented FPs compare with each other?
Keywords
Java; Unified Modeling Language; computer science education; educational courses; object-oriented programming; software cost estimation; software metrics; Java; UML; concept mapping; function point analysis; function point-like object-oriented metrics; masteral students; object-oriented programming; object-oriented software measurement; object-oriented systems; size measurement; software engineering course; Availability; Computer industry; Java; Lab-on-a-chip; Object oriented programming; Size measurement; Software engineering; Software measurement; Testing; Unified modeling language; Function Point Analysis; Object-oriented systems; empirical validation; size measures;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Metrics, 2005. 11th IEEE International Symposium
Conference_Location
Como
ISSN
1530-1435
Print_ISBN
0-7695-2371-4
Type
conf
DOI
10.1109/METRICS.2005.9
Filename
1509318
Link To Document