Title :
Thick Film Microstrip Line Attenuation Measurement to 18GHz
Author :
Verner, W ; Linton, D. ; Stewart, J.A.C. ; Fusco, V. ; Hudson, A
Author_Institution :
Department of Electrical and Electronic Engineering, Queen´´s University of Belfast, N Ireland
Keywords :
Attenuation measurement; Equations; Frequency; Impedance; Length measurement; Microstrip; Neural networks; Reflection; Thick film circuits; Thick films;
Conference_Titel :
Microwave Conference, 1986. 16th European
Conference_Location :
Dublin, Ireland
DOI :
10.1109/EUMA.1986.334285
