• DocumentCode
    2025701
  • Title

    Nonlinear HBT models for HVHBT 15W power amplifiers

  • Author

    Zhang, Xiangkun ; Chau, Frank ; Lin, Barry ; Sun, Xiaopeng ; Ma, Wenlong ; Hu, Peter ; Yao, Jinshi ; Lee, Chien-Ping

  • Author_Institution
    TriQuint Semicond., San Jose, CA, USA
  • fYear
    2009
  • fDate
    28-29 Sept. 2009
  • Firstpage
    89
  • Lastpage
    92
  • Abstract
    Nonlinear HBT models are presented for 15 W power amplifiers with superior back-off linearity. Each amplifier consists of 8 Building Blocks of 28 V InGaP/GaAs HBT. The P1dB is 42 dBm. The models are based on the AHBT model for the Building Block (1 BB) reported previously. The model for the amplifier at 2.14 GHz is scaled from the AHBT model for 1 BB whereas the model for the amplifier at 940 MHz is a revised model due to modifications in the HBT layout designed for that frequency. Key device parameters are adjusted based on the changes in layout and the measured device characteristics to avoid a standard time consuming modeling process. Both models can precisely simulate all aspects of nonlinear performance of amplifiers such as output power, gain, P1dB, operation current, efficiency, IM3 and ACLR. Good match between simulation and measurement has been achieved. Models are used to improve RF and ruggedness performance in amplifier designs.
  • Keywords
    III-V semiconductors; UHF power amplifiers; gallium arsenide; gallium compounds; heterojunction bipolar transistors; indium compounds; semiconductor device models; HBT layout; InGaP-GaAs; back-off linearity; frequency 2.14 GHz; frequency 940 MHz; gain; heterojunction bipolar transistor; high-voltage HBT; nonlinear HBT models; operation current; output power; power amplifiers; voltage 28 V; Frequency; Gallium arsenide; Heterojunction bipolar transistors; Linearity; Measurement standards; Operational amplifiers; Power amplifiers; Power generation; Radiofrequency amplifiers; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Integrated Circuits Conference, 2009. EuMIC 2009. European
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4244-4749-7
  • Type

    conf

  • Filename
    5296470