Near-field imaging with metamaterial: Deconvolution of an image using SVD

Author

Tihon, Denis ; Ozdemir, Nilufer A. ; Craeye, Christophe

Author_Institution

ICTEAM Inst., Univ. Catholique de Louvain, Louvain-la-Neuve, Belgium

fYear

2013

fDate

16-21 Sept. 2013

Firstpage

448

Lastpage

450

Abstract

A deconvolution procedure based on the Array Scanning Method and the Singular Value Decomposition is presented to capture a source distribution from an image affected by white noise. The image is obtained using a collimating metamaterial made of infinite, doubly periodic array of silver nanorods with the help of the Array Scanning Method. The numerical results show that the source distribution can be captured from the image by tuning the threshold in SVD used for inversion, hence by selecting a proper source subspace.

Keywords

deconvolution; image processing; nanophotonics; nanorods; optical arrays; optical metamaterials; silver; singular value decomposition; Ag; SVD; array scanning method; collimating metamaterial; image deconvolution; infinite doubly periodic array; near-field imaging; silver nanorods; singular value decomposition; source distribution; white noise; Arrays; Deconvolution; Imaging; Metamaterials; Noise; Singular value decomposition;

fLanguage

English

Publisher

ieee

Conference_Titel

Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS), 2013 7th International Congress on

Conference_Location

Talence

Print_ISBN

978-1-4799-1229-2

Type

conf

DOI

10.1109/MetaMaterials.2013.6809082

Filename

6809082