• DocumentCode
    2025784
  • Title

    Simulation and testing of large-scale IC ceramic packages with differential routing

  • Author

    Zhang, Xiao-jun ; Duan, Qiang ; Gao, Ling ; Li, Hang-zhou

  • Author_Institution
    Hebei Semiconductor Research Institute, Shijiazhuang, China
  • fYear
    2015
  • fDate
    11-14 Aug. 2015
  • Firstpage
    1494
  • Lastpage
    1496
  • Abstract
    With the Semiconductor technology developing speedly, micro-electronic products have stepped into highly speed and frequency scope, coming with the challenges of micromation and lower power, etc. Digital circuit design is confronted with greater challenge. On one hand, the process technology of integrated circuits turn towards submicron-scale feature sizes, that results in pulse´s edge time descending to microsecond-level or even picoseconds-level. Meanwhile, the level of signals´ keep-time shortens seriously[1]. Based on differential routing principles, simulate software is applied on founding differential routing model. For comparison, simulation and testing methods are adopted to researching impedance of differential traces. Large-scale IC ceramic packages SPGA256 was used to differential impedance simulation and testing.
  • Keywords
    Crosstalk; Impedance measurement; Power transmission lines; Reliability; Semiconductor device measurement; Testing; Transmission line measurements; TDR ceramic packages; differential routing; large-scale IC; simulation and tesing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
  • Conference_Location
    Changsha, China
  • Type

    conf

  • DOI
    10.1109/ICEPT.2015.7236864
  • Filename
    7236864