Investigation of achievable accuracy limit of dielectric layer parameters estimates obtained on basis of reflection coefficient measurements

Minimum, mean and maximum value of the least achievable variance of dielectric layer parameters estimates are evaluated for typical microwave frequency bands used in practice of nondestructive testing. The values of variance are calculated as Cramér-Rao bounds depending on permittivity and thickness of dielectric layer and parameters of frequency grid. The bounds are compared with result of statistical numeric experiment carried out for the purpose of estimation of permittivity and thickness estimates variance provided by quasisolution method.