• DocumentCode
    2026862
  • Title

    Considering multi-cycle influences for signal selection for Post Silicon Validation

  • Author

    Bhattacharya, Arani ; Koley, Subhasis ; Banerjee, Ansuman

  • Author_Institution
    Indian Stat. Inst., Kolkata, India
  • fYear
    2015
  • fDate
    29-30 Jan. 2015
  • Firstpage
    160
  • Lastpage
    164
  • Abstract
    Post-silicon validation is an important step in the chip design life cycle. This involves observing the signal elements of the chip to check if the signals have the expected values. The process essentially requires observing the circuit behaviour (i.e. the signal values) on giving known inputs, and checking for correctness and conformance. The size of the trace buffer which stores the values of the signals during the post-silicon validation step, limits the number of signals that can be observed. Deciding the best signal set to monitor given the constraint on the size of the trace buffer is an important task. In this paper, we present an algorithm for signal selection, that allows us to select signals which, on traced, gives us better restoration than existing techniques.
  • Keywords
    VLSI; buffer circuits; integrated circuit design; silicon; chip design life cycle; post silicon validation; signal selection; trace buffer; Benchmark testing; Electronic mail; Integrated circuit modeling; Logic gates; Proposals; Silicon; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Design, Computer Networks & Automated Verification (EDCAV), 2015 International Conference on
  • Conference_Location
    Shillong
  • Print_ISBN
    978-1-4799-6207-5
  • Type

    conf

  • DOI
    10.1109/EDCAV.2015.7060559
  • Filename
    7060559