Title :
Frequency scanning technique for nondestructive testing. A multi-frequency excitation and spectrogram method
Author :
Enokizono, M. ; Chady, T. ; Todaka, T. ; Tsuchida, Y.
Author_Institution :
Fac. of Eng., Oita Univ., Japan
Abstract :
The purpose of this paper is to present an idea and demonstrate advantages of the multi-frequency excitation spectrogram method. The short explanation of the MFES method is given. The extended experiments were conducted and the selected results are presented in order to confirm advantages of the proposed technique. Methods for flaws identification are also proposed
Keywords :
flaw detection; nondestructive testing; safety; spectrometers; flaws identification; frequency scanning technique; industrial safety; multi-frequency excitation spectrogram method; nondestructive testing; Coils; Electrical capacitance tomography; Ferrites; Frequency; Inspection; Nondestructive testing; Safety; Sensor phenomena and characterization; Spectrogram; Synthesizers;
Conference_Titel :
Industrial Electronics Society, 2000. IECON 2000. 26th Annual Confjerence of the IEEE
Conference_Location :
Nagoya
Print_ISBN :
0-7803-6456-2
DOI :
10.1109/IECON.2000.972392
