• DocumentCode
    2027344
  • Title

    Orthogonal Diagonal Projections for Gait Recognition

  • Author

    Tan, Daoliang ; Huang, Kaiqi ; Yu, Shiqi ; Tan, Tieniu

  • Author_Institution
    Chinese Acad. of Sci., Beijing
  • Volume
    1
  • fYear
    2007
  • fDate
    Sept. 16 2007-Oct. 19 2007
  • Abstract
    Gait has received much attention from researchers in the vision field due to its utility in walker identification. One of the key issues in gait recognition is how to extract discriminative shape features from 2D human silhouette images. This paper deals with the problem of gait-based walker recognition using statistical shape features. First, we normalize walkers´ silhouettes (to facilitate gait feature comparison) into a square form and use the orthogonal projections in the positive and negative diagonal directions to draw personal signatures contained in gait patterns. Then principal component analysis (PCA) and linear discriminant analysis (LDA) are applied to reduce the dimensionality of original gait features and to improve the topological structure in the feature space. Finally, this paper accomplishes the recognition of unknown gait features based on the nearest neighbor rule, with the discussion of the effect of distance metrics and scales on discriminating performance. Experimental results justify the potential of our method.
  • Keywords
    computer vision; feature extraction; gait analysis; image recognition; principal component analysis; 2D human silhouette image; computer vision; discriminative shape feature extraction; distance metric; gait-based walker recognition; linear discriminant analysis; orthogonal diagonal projection; personal signature; principal component analysis; Feature extraction; Humans; Laboratories; Leg; Legged locomotion; Linear discriminant analysis; Pattern recognition; Principal component analysis; Security; Shape; Gait; LDA; PCA; metric; scale; shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2007. ICIP 2007. IEEE International Conference on
  • Conference_Location
    San Antonio, TX
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-1437-6
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2007.4378960
  • Filename
    4378960